Calidad SA
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1
Setup
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Data
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Chart
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Histogram
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Capability
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Report

Set Up Your Analysis

Give your analysis a name and optionally set specification limits to calculate Cp and Cpk.

A descriptive name helps you identify this analysis later. Include part number, feature, or operation.
Enter your tolerance limits from the drawing or spec. These are used to calculate process capability (Cp/Cpk). Leave blank if you only want to see the control chart.
Add context like machine, operator, material batch, or measurement conditions.
Run Rules
1 rule(s) selected
Rule 1 is the default starting point. Turn on extra rules only when you want the chart to look for smaller patterns.
Turn this on to enable all 8 rules. Turn it off to clear every rule.
Flags a single measurement above the upper limit or below the lower limit. This is the strongest and easiest signal to explain.
Looks for two out of three recent points beyond 2 sigma on the same side of the center line. Use this when you want earlier warning of a possible shift.
Looks for four of five recent points beyond 1 sigma on the same side. This is more sensitive than Rule 1 and can trigger more often.
Flags a long run of points all above or all below the center line. This suggests the process average may have moved.
Looks for a steady climb or steady drop across six points. Use it to catch drift over time.
Flags an unusually tight pattern near the center line. This can happen when variation drops or when the data are being smoothed.
Looks for a zig-zag pattern. This can point to over-adjustment or another repeating influence.
Flags eight points that stay away from the center line while alternating sides. This can suggest a mixed or unstable pattern.
More rules can help find subtle changes, but they can also create extra alerts from normal up-and-down noise.
Cancel
XmR Chart (Individuals and Moving Range)

The XmR chart is ideal for small batches and continuous processes where you measure one part at a time. It shows individual values and the variation between consecutive measurements.

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